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FIB image of cut in metal

FIB image of cut through semiconductor device

FIB of TEM specimen preparation

 


 
Hitachi HF2000 Transmission Electron Microscope
Location: 118 EGRC  

TEM Images

The HF 2000 is a Cold Field Emission TEM that is capable of 0.2nm point resolution. This unit is also equipped with a Oxford Link INCA EDS system for elemental analysis down to a 1nm point resolution.

 
Specifications
Capabilities
  

0.2nm point resolution

Source  
Cold Field Emission
Accelerating Voltage
  
200kV
Magnification
  

1,000,000X
Elemental Analysis
 

Oxford INCA EDS
EDS Resolution
 

1 nm
Image Acquisition
 

Digital Camera
   
 
    

Last updated January 22, 2008

Campus Box 7531 Room 318 EGRC, 2410 Campus Shore Dr., Raleigh NC 27695
Phone: (919) 515-2128 or 515-3841 Fax: (919) 515-6965