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Analytical Instrumentation Facility
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SIMS Links

SIMS Logo (www.simsworkshop.org)

Diagram of Cameca S6F

Time vs Counts plot from SIMS

Riber XPS

Diagram of photoelectron excitation by x-ray

XPS analyzer diagram

Plot of XPS results

SIMS Sites
SIMS-WWW Server WWW Server
SIMS Server Links all the links you need
Particle-Surface Resources on the Internet

Tutorials
Sims Tutorial written by Ron Flemming
Brief Sims History  
PHI TOF-SIMS -Description
VG TOF-SIMS -Description
SciMedia Analytical Instrumentation Tutorials (mag/quad/tof/ion-trap)
Vacuum Pages University of Alberta
Ion Implantation Lots of tutorials and links
Semiconductor Manufacturing Process Fullman
Introduction to Surface Science  
Educational Applets in Solid State Materials  
   

Utilities/Software
Webelements Periodic table and chemistry data
NIST Chemistry Webbook
Exact Mass Calculator
AVS Reference and conversion tables
SRIM (TRIM)
SIMION-Ion Trajectory Simulation

Journals
Applied Physics Letters (Full Text) Physical Review Letters (Full Text)
Applied Surface Science (Full Text) Progress in Surface Science (Content)
Int. Journal of Mass Spectrometry and Ion Processes Rapid Com. in Mass Spectrometry (Abstracts/Restricted/)
Journal of the American Society for Mass Spectrometry Semiconductors
Journal of Vacuum Science and Technology B (Full Text /Abstracts) Surface and Interface Analysis (Abstracts/Restricted/)
Mass Spectrometry Review (Content) Surface Science (Full Text)
Nuclear Instruments and Methods B (Content) Wiley Journal Search
Phsical Review B (Full Text)

Books
Secondary Ion Mass Spectrometry, Basic Concepts, Instrumental Aspects, Application and Trends, Wiley (1987) Benninghoven, Rudenbauer & Werner
Secondary Ion Mass Spectrometry, A Practial Handbook for Depth Profiling and Bulk Impurity Analysis, Wiley (1989)
(Good book to start with)
Wilson, Stevie, Magee
   
Last updated January 14, 2005

 

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Phone: (919) 515-2128 or 515-3841 Fax: (919) 515-6965