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Analytical Instrumentation Facility
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AFM image of PEO

AFM phase image of GaN

AFM image of patterned lines on Si

AFM image of MEMS gear


 
Scanning Probe Microscopy Lab
Location: 321 EGRC  
Contact: Chuck Mooney
     
Images of AFM

The SPM lab houses several scanning probe microscopes each with different capabilities. Listed above are the different types available in the lab. Also listed below are tutorials that can be viewed or dowloaded for a brief description of the theory of AFM.

D3000 Specifications
Resolution (vertical & horizontal)
Atomic
Scan System
Sample Scan
Scanner

Tube Scanner, exchangeable
Standard: 10 µm in XY, 3 µm in Z
Optional: 100 µm in XY, 5 µm in Z

Force Detection
Optical lever arm
laser light source
4 segment photodetector
Tunnel Current
30 pA to 1 µA
AFM probe
Silicon and Silicon Nitride
Specimen Size
XY: up to 50 mm square
Z: up to 5 mm thick
Coarse Stage Adjustment
XY stage: +/- 3 mm
Z stage: manual adjustment 5 mm (including stepper motor)
stepper motor adjustment 1.5 mm
Stage
Drift Free design
Vibration Isolation

Air Suspension
Gel damper
Enclosure

 
 
 
 

 


Flash Presentations
Basics of Scanned Probe Microscopy
Image Gallery

SPM Simulations
Force Curve Simulation
AC (Tapping) Mode Simulation
DC (Contact) Mode Simulation

Downloadable PDF
Download Tutorial PDF

 

 

 

Last updated February 4, 2011

Campus Box 7531 Room 318 EGRC, 2410 Campus Shore Dr., Raleigh NC 27695
Phone: (919) 515-2128 or 515-3841 Fax: (919) 515-6965