'High Efficiency GaN-based GaN LEDs and lasers on SiC', J. Edmond, A. Abare, M. Bergman, J. Bharathan, K.L. Bunker, D. Emerson, K. Haberem, J. Ibbetson, M. Leung, P.E. Russell, D. Slater, Journal of Crystal Growth, Volume 272, No. 1-4, Special Issue, Dec. 10, 2004, p. 242-250.

'Scanning electron microscopy cathodoluminescence studies of piezoelectric fields in an InGaN quantum-well light-emitting diode', K.L. Bunker, R. Garcia, P.E. Russell, GaN, AlN, InN and Their Alloys: 2004 , edited by C. Wetzel, B. Gil, M. Kuzuhara, M. Manfra: (Materials Research Society, Boston, 2004), Vol. 831, E11.41.

'Utilization of Electron Impact Ionization of Gaseous and Sputtered Species in the Secondary Ion Acceleration Region of a Magnetic Sector SIMS Instrument', A. Pivovarov, C. Gu, F. Stevie, and D. Griffis, SIMS XIV Proceedings, Applied Surface Science 231-232, 781-785 (2004)

'Improved Charge Neutralization Method for Depth Profiling of Bulk Insulators Using O 2 + Primary Beam on a Magnetic Sector SIMS Instrument', A. L. Pivovarov, F. A. Stevie, and D. P. Griffis, SIMS XIV Proceedings, Applied Surface Science 231-232, 786-790 (2004)

'O 2 + Vs. Cs + for High Depth Resolution Depth Profiling of III-V Nitride Based Semiconductor Devices', M. Kachan, J. Hunter, D. Kouzminov, A. Pivovarov, J. Gu, F. Stevie, and D. Griffis, SIMS XIV Proceedings, Applied Surface Science 231-232, 684-687 (2004)

'Site Specific SIMS Back Side Analysis', C. Gu, R. Garcia, A. Pivovarov, F. Stevie, and D. Griffis, SIMS XIV Proceedings, Applied Surface Science 231-232, 663-667 (2004) Circuit Editing of copper and low-k dielectrics in nanotechnology devices, Mosselveld E., Makorov V.V., Lundquist T.R., Griffis D.P., Russell P.E., J. Microscopy 214(3), 246-251, 2004

'Secondary ion mass spectrometry backside analysis of barrier layers for copper diffusion', J. C. Gu, A. Pivovarov, R. Garcia, F. Stevie, D. Griffis, J. Moran, L. Kulig, and J. F. Richards, Vac. Sci. Technol. B22, 350-354 (2004)

'Circuit Editing of Copper and low-k Dielectrics in nanotechnology Devices', F. Mosselveld, V.V. Makarov, T.R. Lundquist, D.P. Griffis, P.E. Russell, Journal of Microscopy, Vol.214, Pt.3 June 2004, 246-251

'Sample Preparation of Commercial Multiple Quantum Well Laser Diodes for Structural, Compositional, and Electrical Analysis in a Scanning Transmission Electron Microscope', K.L. Bunker, R. Garcia, T.J. Kennedy, T.J. Stark, P.E. Russell, Current Issues on Multidisciplinary Microscopy Research and Education, A. Méndez-Vilas Ed. (FORMATEX, Badajoz, Spain, In Press, 2004), Vol.2.

'Scanning Probe Microscopy and Scanning Electron Microscopy for Electrical Characterization of Semiconductors', J.C. Gonzalez, M.I.N. da Silva, K.L. Bunker, P.E. Russell, Current Issues on Multidisciplinary Microscopy Research and Education, A. Méndez-Vilas Ed. (FORMATEX, Badajoz, Spain, In Press, 2004), Vol.2.

'Method for water vapor enhanced charged-particle-beam machining'; P. E. Russell, D. P. Griffis, G. M. Shedd, T. J. Stark, J. Vitarelli, German Patent DE69,625,050T, September 4, 2004.

'Development of a STEM-EBIC/CL System for Structural, Compositional, Electrical, and Optical Characterization of Quantum Well Devices', K.L. Bunker, R. Garcia, P.E. Russell, Microscopy and Microanalysis 2004, Microscopy and Microanalysis in the Real World: Textiles, Pharmaceuticals, Photonics, and Biomedical/Forensics Poster Session, August 1-5, 2004, Savannah , GA

'Sample Preparation of Fully Packaged Quantum Well Laser Diodes for STEM-EBIC Analysis', R. Garcia, K.L. Bunker, T.J. Kennedy, P.E. Russell, Microscopy and Microanalysis 2004, Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences Poster Session, August 1-5, 2004, Savannah , GA

'Improved Analysis of Bulk Insulators using Magnetic Sector SIMS with O 2 + Primary Beam and Electron Beam Adjacent to Analysis Area', F. A. Stevie, C. Gu, A. Pivovarov, R. Garcia, and D. P. Griffis, AVS 51 st International Sumposium, Nov. 14 (2004)