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'Sample Preparation for Textile Nanofiber Composites',
R. Garcia, N. Federova, V. Knowlton, C. Oldham, B. Pourdeyhimi,
Microscopy Today Vol 13, No 2, pp. 38-40 March 2005.
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'Scanning electron microscopy cathodoluminescence
studies of piezoelectric fields in an InGaN quantum-well light-emitting
diode', K.L. Bunker, R. Garcia, P.E. Russell, Applied
Physics Letters, Volume 86, No. 8, Feb. 21, 2005, p. 1-3.
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'Sample Preparation of Commercial Multiple Quantum
Well Laser Diodes for Structural, Compositional, and Electrical
Analysis in a Scanning Transmission Electron Microscope' ,
K.L. Bunker, R. Garcia, T.J. Kennedy, T.J. Stark, P.E. Russell, Science,
Technology and Education of Microscopy: an Overview ,
Vol. 2, edited by A. Méndez-Vilas: (FORMATEX, Badajoz,
Spain, 2005).
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'Scanning Probe Microscopy and Scanning Electron
Microscopy for Electrical Characterization of Semiconductors' ,
J.C. Gonzalez, M.I.N. da Silva, K.L. Bunker, P.E. Russell, Science,
Technology and Education of Microscopy: an Overview ,
Vol. 2, edited by A. Méndez-Vilas: (FORMATEX, Badajoz,
Spain, 2005).
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'Focused Ion Beam Gases for Deposition and Enhanced
Etch', F. A. Stevie, D. P. Griffis, and P. E. Russell,
Chapter in Introduction to Focused Ion Beams: Instrumentation,
Theory, Techniques, and Practice, L. A. Giannuzzi and F.
A. Stevie, Eds., Springer, New York (2005)
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'The Focused Ion
Beam Instrument', F. A. Stevie, L. A. Giannuzzi,
and B. I. Prenitzer, Chapter in Introduction to Focused Ion
Beams: Instrumentation, Theory, Techniques, and Practice, L.
A. Giannuzzi and F. A. Stevie, Eds., Springer, New York (2005) |
'FIB Lift-Out Specimen
Preparation Techniques', L. A. Giannuzzi,
B. W. Kempshall, S. M. Schwarz, J. K. Lomness, B. I. Prenitzer,
and F. A. Stevie, Chapter in Introduction to Focused Ion Beams:
Instrumentation, Theory, Techniques, and Practice, L. A. Giannuzzi
and F. A. Stevie, Eds., Springer, New York (2005)
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'Focused Ion Beam
Secondary Ion Mass Spectrometry (FIB-SIMS)',
F. A. Stevie, Chapter in Introduction to Focused Ion Beams:
Instrumentation, Theory, Techniques, and Practice, L. A. Giannuzzi
and F. A. Stevie, Eds., Springer, New York (2005)
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'Diffusion Profiles
of High Dosage Cr and V Ions Implanted Into Silicon', P. Zhang, F. A. Stevie, R. Vanfleet, R. Neelakantan,
M. Klimov, D. Zhou, and L. Chow, J. Appl. Phys. July (2004)
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'Direct Observation
of Diffusion-Controlled Reactive Coupling at Polymer-Polymer
Interfaces', S. E. Harton, F. A. Stevie,
and H. Ade, Macromolecules 38, 3543 (2005)
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| Presentations 2005 |
'A quantitative study of the cleaning effectiveness
of the Evactron(R) RF plasma system on a scanning electron
microscope' R. Garcia, C.B. Mooney, A.D Batchelor,
K.L. Bunker, A.D. Garetto, V.L. Carlino, R. Vane and P.E.
Russell, Microscopy and Microanalysis 2005 SEM Poster
Session July 31- August 4, 2005 Honolulu , HI
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'The Evolution of Scanned Probe Microscopy:
Two Decades of Rapidly Evolving Techniques and Applications' Presidential
Symposium: The Golden Anniversary of Imaging Atoms Invited
Talk, P E Russell, M E Salmon,Microscopy and Microanalysis
2005 SEM Poster Session July 31- August 4, 2005 Honolulu
, HI
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'Scanning electron microscopy cathodoluminescence
studies of piezoelectric fields in an InGaN quantum-well
light-emitting diode' K.L. Bunker, R. Garcia,
P.E. Russell Microscopy and Microanalysis 2005 Semiconductors
Poster Session July 31- August 4, 2005 Honolulu , HI
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'Growth and Characterization of Self-assembled
Nanofibers' M E Salmon, P E Russell, E B
Troughton, Microscopy and Microanalysis 2005 Scanned
Probe Microscopy and Nanoanalysis Poster Session July 31-
August 4, 2005 Honolulu , HI
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'Growth Mechanisms of Electron Beam Induced
Carbon Deposition Using Hydrocarbon Contamination' A D Garetto, D D Griffis, P E Russell, P D Rack, J Fowlkes, Microscopy
and Microanalysis 2005 FIB/Dual Platform Applications and Techniques
Poster Session July 31- August 4, 2005 Honolulu , HI
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'Focused Ion Beam Sample Preparation of Complex
Devices' P E Russell, K L Bunker, R Garcia,
T J Stark, J P Vitarelli, Microscopy and Microanalysis
2005 FIB/Dual Platform Applications and Techniques
Invited Speaker July 31- August 4, 2005 Honolulu , HI
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'SIMS Quantification
of Matrix and Impurity Species in Al x Ga 1-x N', C. J. Gu , F. A. Stevie, Y. N.
Saripalli, M. Johnson, D. Griffis, SIMS Workshop, Hilton
Head, May 2-5 (2005)
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'Back Side SIMS
Analysis of Hafnium Silicate',
C. Gu, F. A. Stevie, J. Bennett, R. Garcia, D. P. Griffis,
SIMS Workshop, Hilton Head, May 2-5 (2005)
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'SIMS Depth Profiling
of Deuterium Labeled Polymers in Polymer Multilayers', Shane E. Harton, Harald
Ade , Fred A. Stevie, Dieter P. Griffis, SIMS Workshop, Hilton
Head, May 2-5 (2005)
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'Ion Implantation
for Quantitative SIMS Analysis', F. A. Stevie, Invited tutorial at SIMS Workshop,
Hilton Head, May 2-5 (2005)
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'Strategies for
SIMS Analysis of Insulators',
F. A. Stevie, Invited Tutorial at SIMS Workshop, Hilton Head,
May 2-5 (2005)
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'New Approaches
to Materials Characterization of Surface and Near Surface
Regions', F. A. Stevie, invited
talk at AVS Atlantic Chapter Spring Program at Jefferson
Laboratory, April 21, 2005
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'Analysis Strategies
for Magnetic Sector SIMS Analysis of Insulators', F. A. Stevie, A. Pivovarov,
C. Gu, and D. P. Griffis, Invited talk at Surface Analysis
2005, Florida Chapter AVS, Orlando, FL March 14-16 (2005)
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Last
updated
August 10, 2005
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