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Faculty Profiles

Harald Ade

Nano Research Area

  • Nano-Characterization
  • Nano-Electronics
  • Nano-Materials & Engineering
 

Research Summary

The Ade research group is developing and using novel characterization tools to determine the composition, morphology and structure of polymeric and electronic materials at the sub-micron spatial scale. Of particular interest is the quantitative mapping of the chemical composition, the orientation of specific chemical groups in multi-component polymeric devices, the interface structure and the structure-property relationships in these materials.

Characterization is achieved by Near Edge X-ray Absorption Fine Structure (NEXAFS) microscopy and through the use of Resonant Soft X-ray Reflectivity and Scattering (RSoXR/RSoXS). The latter methods are still under active development and hold great promise as characterization tools for organic materials. The research is highly interdisciplinary and benefits from extensive collaborations with other research groups and industry. H. Ade has lead a team that developed a Scanning Transmission X-ray Microscope at the Advanced Light Source in Berkeley dedicated to the research of synthetic and natural polymers. This "Polymer STXM" team is comprised of researchers from NCSU, McMaster, Dow Chemical, ALS, SUNY@Stony Brook, NIST, and the Geophysical Laboratory. The microscope developed is now commercially available in adapted form from Accel.

Dr. Ade was elected as a fellow of the American Association for the Advancement of Science (AAAS) in 2011 for transformational contributions to X-ray microscopy and soft x-ray scattering. His work has had an impact in disciplines ranging from polymer science to environmental science to meteoritics.

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