Dr. Dieter Griffis

Director, Analytical Instrumentation Facility; Research Associate Professor Of Materials Science And Engineering

Microscopy, microanalysis and surface analysis of materials and focused ion beam nanofabrication, sample preparation and analysis. Design of  analytical experiments, instrument operation and interpretation of  results for analytical techniques including secondary ion mass spectrometry, focused ion beam nanomachining, X-ray photoelectron spectrometry, transmission and secondary electron microscopy, and scanning probe microscopy. Directs the Analytical Instrumentation Facility, which provides on-demand analytical services, contract research and collaborative research